Direct observation for atomically flat and ordered vertical {111} side-surfaces on three-dimensionally figured Si(110) substrate using scanning tunneling microscopy

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Journal

  • Japanese Journal of Applied Physics

    Japanese Journal of Applied Physics 56(11), 111301-111301, 2017-10-02

    IOP Publishing

Codes

  • NII Article ID (NAID)
    210000148418
  • ISSN
    0021-4922
  • Data Source
    Crossref 
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