Noncontact measurement of substrate temperature by optical low-coherence interferometry in high-power pulsed magnetron sputtering
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 57 (1S), 01AC03-, 2017-11-13
IOP Publishing
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Details 詳細情報について
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- CRID
- 1360284924868123648
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- NII Article ID
- 210000148541
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- ISSN
- 13474065
- 00214922
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- Data Source
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- Crossref
- CiNii Articles
- KAKEN