High-sensitivity visualization of localized electric fields using low-energy electron beam deflection

• Samuel Jeong

• Yoshikazu Ito

• Gary Edwards

• Jun-ichi Fujita

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 57 (6), 065201-, 2018-05-08

  IOP Publishing

キーワード

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

詳細情報

• CRID: 1360003449891674240
• NII論文ID: 210000149125
• DOI: 10.7567/jjap.57.065201
• ISSN: 13474065
• ISSN: 00214922
• Web Site: http://stacks.iop.org/1347-4065/57/i=6/a=065201/pdf
• Web Site: http://stacks.iop.org/1347-4065/57/i=6/a=065201?key=crossref.8bb12625d25e8c71681a3e21f5d2ad69
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