Investigation of surface potentials in reduced graphene oxide flake by Kelvin probe force microscopy

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Journal

  • Japanese Journal of Applied Physics

    Japanese Journal of Applied Physics 57(6S1), 06HD02-06HD02, 2018-05-02

    IOP Publishing

Codes

  • NII Article ID (NAID)
    210000149153
  • ISSN
    0021-4922
  • Data Source
    Crossref 
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