Analytical formula for temperature dependence of resistivity in p-type 4H-SiC with wide-range doping concentrations

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Journal

  • Japanese Journal of Applied Physics

    Japanese Journal of Applied Physics 57(8), 088002-088002, 2018-06-29

    IOP Publishing

Codes

  • NII Article ID (NAID)
    210000149429
  • ISSN
    0021-4922
  • Data Source
    Crossref 
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