Strategy to utilize transmission electron microscopy and X-ray diffraction to investigate biaxial strain effect in epitaxial BiFeO<sub>3</sub> films
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 57 (9), 0902A5-, 2018-06-28
IOP Publishing
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Details 詳細情報について
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- CRID
- 1360284924868584192
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- NII Article ID
- 210000149591
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- ISSN
- 13474065
- 00214922
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- Data Source
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- Crossref
- CiNii Articles
- KAKEN