Electric transport properties for three-dimensional angular-interconnects of Au wires crossing facet edges of atomically-flat Si{111} surfaces

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Journal

  • Japanese Journal of Applied Physics

    Japanese Journal of Applied Physics 57(9), 090303-090303, 2018-07-26

    IOP Publishing

Codes

  • NII Article ID (NAID)
    210000149607
  • ISSN
    0021-4922
  • Data Source
    Crossref 
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