Electric transport properties for three-dimensional angular-interconnects of Au wires crossing facet edges of atomically-flat Si{111} surfaces
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 57 (9), 090303-, 2018-07-26
IOP Publishing
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詳細情報
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- CRID
- 1360284924868590080
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- NII論文ID
- 210000149607
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- ISSN
- 13474065
- 00214922
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- データソース種別
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- Crossref
- CiNii Articles
- KAKEN