Structural stability and energy levels of carbon-related defects in amorphous SiO₂ and its interface with SiC

• Yu-ichiro Matsushita

• Atsushi Oshiyama

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 57 (12), 125701-, 2018-11-16

  IOP Publishing

Keywords

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

Details

• CRID: 1360284924868732032
• NII Article ID: 210000149880
• DOI: 10.7567/jjap.57.125701
• ISSN: 13474065
• ISSN: 00214922
• Web Site: http://stacks.iop.org/1347-4065/57/i=12/a=125701/pdf
• Web Site: http://stacks.iop.org/1347-4065/57/i=12/a=125701?key=crossref.b47e857ff860bf4cab5723c129176f5e
• Data Source:
  • Crossref
  • CiNii Articles
  • KAKEN