Quantitative analysis of lattice plane microstructure in the growth direction of a modified Na-flux GaN crystal using nanobeam X-ray diffraction

• Kazuki Shida

• Nozomi Yamamoto

• Tetsuya Tohei

• Masayuki Imanishi

• Yusuke Mori

• Kazushi Sumitani

• Yasuhiko Imai

• Shigeru Kimura

• Akira Sakai

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 58 (SC), SCCB16-, 2019-05-09

  IOP Publishing

キーワード

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

詳細情報

• CRID: 1360566399836019840
• NII論文ID: 210000155953
• DOI: 10.7567/1347-4065/ab0d05
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.7567/1347-4065/ab0d05/pdf
• Web Site: https://iopscience.iop.org/article/10.7567/1347-4065/ab0d05
• データソース種別:
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  • KAKEN