Fabrication and physical properties of bismuth layer-structured ferroelectric thin films with <i>c</i>-axis orientation epitaxially grown by high-temperature sputtering
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 58 (SL), SLLB09-, 2019-08-23
IOP Publishing
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Details 詳細情報について
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- CRID
- 1360847874812999680
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- NII Article ID
- 210000156891
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- ISSN
- 13474065
- 00214922
- http://id.crossref.org/issn/13474065
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- Data Source
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- Crossref
- CiNii Articles
- KAKEN