Temperature dependence of dielectric functions in Yb<sub>2</sub>O<sub>3</sub> and Lu<sub>2</sub>O<sub>3</sub> epitaxial thin films on sapphire (0001)
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 59 (SC), SCCB13-, 2019-12-05
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360847874813061760
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- NII論文ID
- 210000157259
- 120006865032
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- ISSN
- 13474065
- 00214922
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- データソース種別
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- Crossref
- CiNii Articles
- KAKEN