Present status of photoemission electron microscope newly installed in SPring-8 for time-resolved nanospectroscopy

• Takuo Ohkochi

• Hitoshi Osawa

• Akinobu Yamaguchi

• Hidenori Fujiwara

• Masaki Oura

Abstract

A photoemission electron microscope (PEEM) system has been newly installed at the soft X-ray undulator beamline (BL17SU) of SPring-8 to realize time-resolved nanospectroscopy for the local transient electronic structures of advanced materials. This PEEM is a versatile machine composed of an electrostatic lens system and is intended for use in specific experiments such as time-resolved measurements. Pump–probe measurements in tandem with a femtosecond pulsed-laser system and an X-ray chopper are now readily available.

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 58 (11), 118001-, 2019-10-18

  IOP Publishing

Keywords

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

Details

• CRID: 1360003449882937216
• NII Article ID: 210000157281
• DOI: 10.7567/1347-4065/ab4b12
• ISSN: 13474065
• ISSN: 00214922
• Web Site: http://iopscience.iop.org/article/10.7567/1347-4065/ab4b12
• Web Site: http://iopscience.iop.org/article/10.7567/1347-4065/ab4b12/pdf
• Web Site: https://iopscience.iop.org/article/10.7567/1347-4065/ab4b12/pdf
• Web Site: https://iopscience.iop.org/article/10.7567/1347-4065/ab4b12
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