Preparation and thermoelectric characterization of phosphorus-doped Si nanocrystals/silicon oxide multilayers

• Hisayoshi Kobayashi

• Ryushiro Akaishi

• Shinya Kato

• Masashi Kurosawa

• Noritaka Usami

• Yasuyoshi Kurokawa

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 59 (SG), SGGF09-, 2020-02-28

  IOP Publishing

詳細情報

• CRID: 1360847874813183232
• NII論文ID: 210000157822
• DOI: 10.7567/1347-4065/ab6346
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.7567/1347-4065/ab6346
• Web Site: https://iopscience.iop.org/article/10.7567/1347-4065/ab6346/pdf
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