Atomic resolution imaging of Si(1 0 0)1×1:2H dihydride surface with noncontact atomic force microscopy (NC-AFM)

• S. Araragi

• A. Yoshimoto

• N. Nakata

• Y. Sugawara

• S. Morita

収録刊行物

• Applied Surface Science

  Applied Surface Science 188 (3-4), 272-278, 2002-03

  Elsevier BV

キーワード

• Surfaces, Coatings and Films
• Condensed Matter Physics
• Surfaces and Interfaces
• General Physics and Astronomy
• General Chemistry

詳細情報

• CRID: 1362262943776623744
• NII論文ID: 30002964533
• DOI: 10.1016/s0169-4332(01)00938-2
• ISSN: 01694332
• Web Site: https://api.elsevier.com/content/article/PII:S0169433201009382?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0169433201009382?httpAccept=text/plain
• データソース種別:
  • Crossref
  • CiNii Articles