The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope

• Kenji Okamoto

• Yasuhiro Sugawara

• Seizo Morita

収録刊行物

• Applied Surface Science

  Applied Surface Science 188 (3-4), 381-385, 2002-03

  Elsevier BV

キーワード

• Surfaces, Coatings and Films
• Condensed Matter Physics
• Surfaces and Interfaces
• General Physics and Astronomy
• General Chemistry

詳細情報

• CRID: 1360011143538805888
• NII論文ID: 30002964536
• DOI: 10.1016/s0169-4332(01)00953-9
• ISSN: 01694332
• Web Site: https://api.elsevier.com/content/article/PII:S0169433201009539?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0169433201009539?httpAccept=text/plain
• データソース種別:
  • Crossref
  • CiNii Articles