Defects and their charge imaging on semiconductor surfaces by noncontact atomic force microscopy and spectroscopy

• S Morita

• M Abe

• K Yokoyama

• Y Sugawara

収録刊行物

• Journal of Crystal Growth

  Journal of Crystal Growth 210 (1-3), 408-415, 2000-03

  Elsevier BV

キーワード

• Materials Chemistry
• Inorganic Chemistry
• Condensed Matter Physics

詳細情報

• CRID: 1360574095492126592
• NII論文ID: 30004620668
• DOI: 10.1016/s0022-0248(99)00720-4
• ISSN: 00220248
• Web Site: https://api.elsevier.com/content/article/PII:S0022024899007204?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0022024899007204?httpAccept=text/plain
• データソース種別:
  • Crossref
  • CiNii Articles