Fluorescence measurement of nanopillars fabricated by high-aspect-ratio nanoprint technology

• KUWABARA K

Journal

• Microelectronic Engineering

  Microelectronic Engineering 73 752-, 2004

Details

• CRID: 1573387450982249344
• NII Article ID: 30005466827
• DOI: 10.1016/j.mee.2004.03.047
• Data Source:
  • CiNii Articles