High-resolution electron microscopy and X-ray diffraction studies of MCM-48

• Ralf Schmidt

• Michael Stöcker

• Duncan Akporiaye

• Elisabeth Heggelund Tørstad

• Arne Olsen

収録刊行物

• Microporous Materials

  Microporous Materials 5 (1-2), 1-7, 1995-10

  Elsevier BV

キーワード

• General Engineering
• General Materials Science
• General Chemistry

詳細情報

• CRID: 1360011143597904384
• NII論文ID: 30005479443
• DOI: 10.1016/0927-6513(95)00030-d
• ISSN: 09276513
• Web Site: https://api.elsevier.com/content/article/PII:092765139500030D?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:092765139500030D?httpAccept=text/plain
• データソース種別:
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