Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon

• J CHEN

• T SEKIGUCHI

• R XIE

• P AHMET

• T CHIKYO

• D YANG

• S ITO

• F YIN

収録刊行物

• Scripta Materialia

  Scripta Materialia 52 (12), 1211-1215, 2005-06

  Elsevier BV

キーワード

• Condensed Matter Physics
• General Materials Science
• Mechanics of Materials
• Metals and Alloys
• Mechanical Engineering

詳細情報

• CRID: 1361699994747032832
• NII論文ID: 30005617373
• DOI: 10.1016/j.scriptamat.2005.03.010
• ISSN: 13596462
• Web Site: https://api.elsevier.com/content/article/PII:S1359646205001430?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S1359646205001430?httpAccept=text/plain
• データソース種別:
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  • CiNii Articles