Ion beam crystallography of metal-silicon interfaces: Pd-Si(111)

• R. Tromp

• E.J. Van Loenen

• M. Iwami

• R. Smeenk

• F.W. Saris

収録刊行物

• Thin Solid Films

  Thin Solid Films 93 (1-2), 151-159, 1982-07

  Elsevier BV

キーワード

• Materials Chemistry
• Metals and Alloys
• Surfaces, Coatings and Films
• Surfaces and Interfaces
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360016868782572032
• NII論文ID: 30006187268
• DOI: 10.1016/0040-6090(82)90100-6
• ISSN: 00406090
• Web Site: https://api.elsevier.com/content/article/PII:0040609082901006?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:0040609082901006?httpAccept=text/plain
• データソース種別:
  • Crossref
  • CiNii Articles