Stable silicon photodiodes for absolute intensity measurements in the VUV and soft X-ray regions
収録刊行物
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- Journal of Electron Spectroscopy and Related Phenomena
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Journal of Electron Spectroscopy and Related Phenomena 80 313-316, 1996-05
Elsevier BV
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詳細情報
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- CRID
- 1361699996180297728
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- NII論文ID
- 30007782540
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- ISSN
- 03682048
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- データソース種別
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- Crossref
- CiNii Articles