Lowering the limit of detection in high spatial resolution electron beam microanalysis with the microcalorimeter energy dispersive X-ray spectrometer

• Dale Newbury

• David Wollman

• Kent Irwin

• Gene Hilton

• John Martinis

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 78 (1-4), 73-88, 1999-06

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1363670318761927552
• NII論文ID: 30008697299
• DOI: 10.1016/s0304-3991(99)00028-5
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:S0304399199000285?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0304399199000285?httpAccept=text/plain
• データソース種別:
  • Crossref
  • CiNii Articles