Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy

• FOETH M.

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 75 (4), 203-213, 1999

詳細情報

• CRID: 1572543026065015680
• NII論文ID: 30008697710
• DOI: 10.1016/s0304-3991(98)00060-6
• データソース種別:
  • CiNii Articles