Measurement of the modulation transfer function of a slow-scan CCD camera on a TEM using a thin amorphous film as test signal

• VAN ZWET EJ.

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 64 49-55, 1996

詳細情報

• CRID: 1571980076111661312
• NII論文ID: 30008697931
• DOI: 10.1016/0304-3991(96)00014-9
• データソース種別:
  • CiNii Articles