Quantitative analysis of the deformation and chemical profiles of strained multilayers

• P. Bayle

• T. Deutsch

• B. Gilles

• F. Lançon

• A. Marty

• J. Thibault

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 56 (1-3), 94-107, 1994-11

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360581244895702912
• NII論文ID: 30008698323
• DOI: 10.1016/0304-3991(94)90149-x
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:030439919490149X?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:030439919490149X?httpAccept=text/plain
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