Quantitative method of assessing the nature of local order from HREM images for SRO on crystalline sublattices

• M.J. Hytch

• J.-P. Chevalier

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 52 (3-4), 415-420, 1993-12

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1363670319973575808
• NII論文ID: 30008698499
• DOI: 10.1016/0304-3991(93)90055-3
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:0304399193900553?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:0304399193900553?httpAccept=text/plain
• データソース種別:
  • Crossref
  • CiNii Articles