Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum

• F.J. Giessibl

• G. Binnig

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 42-44 281-289, 1992-07

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1361981470289113600
• NII論文ID: 30008699012
• DOI: 10.1016/0304-3991(92)90280-w
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:030439919290280W?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:030439919290280W?httpAccept=text/plain
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