Quantification in high-resolution electron microscopy with the imaging plate

• D. Shindo

• K. Hiraga

• T. Oku

• T. Oikawa

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 39 (1-4), 50-57, 1991-11

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1362825894810869888
• NII論文ID: 30008699217
• DOI: 10.1016/0304-3991(91)90181-5
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:0304399191901815?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:0304399191901815?httpAccept=text/plain
• データソース種別:
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  • CiNii Articles