Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy

• O. Hayes Griffith

• Wilfried Engel

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 36 (1-3), 1-28, 1991-05

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1362262943329824896
• NII論文ID: 30008699345
• DOI: 10.1016/0304-3991(91)90135-s
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:030439919190135S?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:030439919190135S?httpAccept=text/plain
• データソース種別:
  • Crossref
  • CiNii Articles