Light-element analysis with electrons and x-rays in a high-resolution STEM

• L.E. Thomas

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 18 (1-4), 173-184, 1985-01

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1364233269926996608
• NII論文ID: 30008700663
• DOI: 10.1016/0304-3991(85)90135-4
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:0304399185901354?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:0304399185901354?httpAccept=text/plain
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