Imaging individual atoms inside crystals with ADF-STEM

• P.M. Voyles

• J.L. Grazul

• D.A. Muller

Journal

• Ultramicroscopy

  Ultramicroscopy 96 (3-4), 251-273, 2003-09

  Elsevier BV

Keywords

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

Details

• CRID: 1362544418501540992
• NII Article ID: 30008701927
• DOI: 10.1016/s0304-3991(03)00092-5
• ISSN: 03043991
• ISSN: http://id.crossref.org/issn/03043991
• Web Site: https://api.elsevier.com/content/article/PII:S0304399103000925?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0304399103000925?httpAccept=text/plain
• Data Source:
  • Crossref
  • CiNii Articles