Peak assignments of ELNES and XANES using overlap population diagrams

• Teruyasu Mizoguchi

• Kazuyoshi Tatsumi

• Isao Tanaka

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 106 (11-12), 1120-1128, 2006-10

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360292621001016704
• NII論文ID: 30008702033
• DOI: 10.1016/j.ultramic.2006.04.027
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:S0304399106001136?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0304399106001136?httpAccept=text/plain
• データソース種別:
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  • CiNii Articles