Calculation of the cross sections of electron interaction with matter

• F. Arnal

• J.L. Balladore

• G. Soum

• P. Verdier

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 2 305-310, 1976-01

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360298342138087168
• NII論文ID: 30008702444
• DOI: 10.1016/s0304-3991(76)91844-1
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:S0304399176918441?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0304399176918441?httpAccept=text/plain
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