Performance evaluation of BLAST-OFDM enhanced Hiperlan/2 using simulated and measured channel data

• R.J. Piechocki

• P.N. Fletcher

• A.R. Nix

• C.N. Canagarajah

• J.P. McGeehan

収録刊行物

• Electronics Letters

  Electronics Letters 37 (18), 1137-, 2001

  Institution of Engineering and Technology (IET)

キーワード

• Electrical and Electronic Engineering

詳細情報

• CRID: 1361137046333184128
• NII論文ID: 30015040889
• DOI: 10.1049/el:20010767
• ISSN: 00135194
• Web Site: https://digital-library.theiet.org/content/journals/10.1049/el_20010767?crawler=true&mimetype=application/pdf
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  • CiNii Articles