All high <i>T</i> <i>c</i> edge junctions and SQUIDs

DOI PDF 被引用文献12件
  • R. B. Laibowitz
    IBM Research Division, P.O. Box 218, Yorktown Heights, New York 10598
  • R. H. Koch
    IBM Research Division, P.O. Box 218, Yorktown Heights, New York 10598
  • A. Gupta
    IBM Research Division, P.O. Box 218, Yorktown Heights, New York 10598
  • G. Koren
    IBM Research Division, P.O. Box 218, Yorktown Heights, New York 10598
  • W. J. Gallagher
    IBM Research Division, P.O. Box 218, Yorktown Heights, New York 10598
  • V. Foglietti
    IBM Research Division, P.O. Box 218, Yorktown Heights, New York 10598
  • B. Oh
    IBM Research Division, P.O. Box 218, Yorktown Heights, New York 10598
  • J. M. Viggiano
    IBM Research Division, P.O. Box 218, Yorktown Heights, New York 10598

抄録

<jats:p>We present the first observations of superconducting quantum interference in multilevel, all high Tc, lithographically patterned edge junction structures. The current-voltage characteristics are nonhysteretic and have well-defined critical currents. The dynamic resistance is independent of current above the critical current. These devices show periodic sensitivity to magnetic fields and low levels of magnetic hysteresis up to temperatures around 60 K.</jats:p>

収録刊行物

被引用文献 (12)*注記

もっと見る

キーワード

詳細情報 詳細情報について

問題の指摘

ページトップへ