A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer

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  • L. G. Schulz
    Institute for the Study of Metals, University of Chicago, Chicago, Illinois

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<jats:p>A new reflection method is described for determining pole figures of flat samples with a Geiger counter x-ray spectrometer. The chief advantage of the method is that the experimental data may be used directly without corrections for changes in geometry during rotation of the sample. Beginning from an initial position identical with the usual reflection arrangement the sample is rotated about an axis defined by the intersection of the sample surface with the plane of the spectrometer. During this motion a randomly oriented sample of sufficient thickness will yield a constant counting rate because the absorption and effective scattering volume of the sample remain unchanged. As a result, no correction formula is required. The experimental arrangement requires three horizontal slits; two are used to collimate the incident beam, and the third is placed in front of the counter. A mathematical analysis of the optical elements of the arrangement is given together with the results from a practical application.</jats:p>

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