Development of electron-ion coincidence spectroscopy for the study of surface dynamics combined with synchrotron radiation

• Kazuhiko Mase

  Institute for Molecular Science, Okazaki 444, Japan

• Mitsuru Nagasono

  Institute for Molecular Science, Okazaki 444, Japan

• Shin-ichiro Tanaka

  Institute for Molecular Science, Okazaki 444, Japan

• Masao Kamada

  Institute for Molecular Science, Okazaki 444, Japan

• Tsuneo Urisu

  Institute for Molecular Science, Okazaki 444, Japan

• Yoshitada Murata

  The University of Electro-communications, Choufu, Tokyo 182, Japan

抄録

Energy-selected electron-ion coincidence spectroscopy for the study of surface dynamics combined with synchrotron radiation (SR) was developed. The equipment consists of an electron gun, a cylindrical mirror analyzer (CMA), and a time-of-flight (TOF) ion mass spectrometer. A sample surface was excited by SR, and energy of the emitted electron was analyzed by the CMA. The TOF spectrum of the desorbed ions was measured taking the energy-analyzed electron signal as the starting trigger. The ions coincidently desorbed with the electron gave a characteristic peak in the TOF spectrum. The apparatus was evaluated on the basis of photoelectron–photoion coincidence (PEPICO) and Auger electron–photoion coincidence (AEPICO) measurements of H2O condensed on gold foil. The results demonstrate that PEPICO and AEPICO combined with SR are powerful methods for investigating the ion desorption induced by core-level excitations.

収録刊行物

• Review of Scientific Instruments

  Review of Scientific Instruments 68 (4), 1703-1707, 1997-04-01

  AIP Publishing

キーワード

• Instrumentation

詳細情報

• CRID: 1363388844686206336
• NII論文ID: 30015946834
• DOI: 10.1063/1.1147978
• ISSN: 10897623
• ISSN: 00346748
• Web Site: https://pubs.aip.org/aip/rsi/article-pdf/68/4/1703/19167314/1703_1_online.pdf
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