Quantitative x-ray emission from a DPF device

• P. G. Burkhalter

  Naval Research Laboratory, Washington, DC 20375-5000

• G. Mehlman

  Naval Research Laboratory, Washington, DC 20375-5000

• D. A. Newman

  Naval Research Laboratory, Washington, DC 20375-5000

• M. Krishnan

  Science Research Laboratory, Alameda, California 94501

• R. R. Prasad

  Science Research Laboratory, Alameda, California 94501

抄録

The x-ray emission was measured from a Dense Plasma Focus (DPF) device. The high density plasma is generated by an electrical discharge in rarefied-neon gas between electrodes in a Mather-type plasma focus configuration. A curved-crystal x-ray spectrograph, a pinhole camera, and an active-filtered photodiode were the diagnostics viewing the axial output of the pinched-plasma region. The x-ray pinhole images indicate a pinched volume roughly 8 mm in length with a nearly circular cross section of about 300 μm in diameter. The digitized spectral traces were computer processed to obtain absolute x-ray line intensities. The neon plasma yielded 10–15 J of K-shell radiation into 4π with the hydrogenlike and heliumlike alpha lines totaling 55%–65% of the total spectral emission. The x-ray emission of the DPF device was studied as a function of discharge current and anode diameter.

収録刊行物

• Review of Scientific Instruments

  Review of Scientific Instruments 63 (10), 5052-5055, 1992-10-01

  AIP Publishing

キーワード

• Instrumentation

詳細情報

• CRID: 1363670321254841984
• NII論文ID: 30015954191
• DOI: 10.1063/1.1143489
• ISSN: 10897623
• ISSN: 00346748
• Web Site: https://pubs.aip.org/aip/rsi/article-pdf/63/10/5052/19242055/5052_1_online.pdf
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