Anisotropic Etching of Crystalline Silicon in Alkaline Solutions: I . Orientation Dependence and Behavior of Passivation Layers
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- H. Seidel
- Messerschmitt‐Bölkow‐Blohm GmbH, D‐8000 Munich 80, Germany
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- L. Csepregi
- Messerschmitt‐Bölkow‐Blohm GmbH, D‐8000 Munich 80, Germany
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- A. Heuberger
- Messerschmitt‐Bölkow‐Blohm GmbH, D‐8000 Munich 80, Germany
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- H. Baumgärtel
- Messerschmitt‐Bölkow‐Blohm GmbH, D‐8000 Munich 80, Germany
収録刊行物
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- Journal of The Electrochemical Society
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Journal of The Electrochemical Society 137 (11), 3612-3626, 1990-11-01
The Electrochemical Society
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キーワード
詳細情報 詳細情報について
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- CRID
- 1361137044909178368
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- NII論文ID
- 30016156183
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- ISSN
- 19457111
- 00134651
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- データソース種別
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- Crossref
- CiNii Articles