Erratum: Concentration of native point defects in Si single crystals at high temperatures

• Yasumasa Okada

収録刊行物

• Physical Review B

  Physical Review B 45 (11), 6352-6352, 1992-03-15

  American Physical Society (APS)

詳細情報

• CRID: 1360581248089005440
• NII論文ID: 30019039665
• NII書誌ID: AA00773566
• DOI: 10.1103/physrevb.45.6352
• ISSN: 10953795
• ISSN: 01631829
• Web Site: http://link.aps.org/article/10.1103/PhysRevB.45.6352
• Web Site: http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.45.6352/fulltext
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