Si(100)-(2×1) surface defects and dissociative and nondissociative adsorption of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">H</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>O studied with scanning tunneling microscopy

• M. Chander

• Y. Z. Li

• J. C. Patrin

• J. H. Weaver

Journal

• Physical Review B

  Physical Review B 48 (4), 2493-2499, 1993-07-15

  American Physical Society (APS)

Details

• CRID: 1360292618712368128
• NII Article ID: 30019061377
• NII Book ID: AA00773566
• DOI: 10.1103/physrevb.48.2493
• ISSN: 10953795
• ISSN: 01631829
• Web Site: http://link.aps.org/article/10.1103/PhysRevB.48.2493
• Web Site: http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.48.2493/fulltext
• Data Source:
  • Crossref
  • CiNii Articles