Recording studies of sub-micron write heads by focused ion beam trimming

• G.L. Gorman

• Lang Vo

• B.H.L. Hu

• Ching Tsang

• J. Cser

• J. Lindquist

Journal

• IEEE Transactions on Magnetics

  IEEE Transactions on Magnetics 33 (5), 2824-2826, 1997

  Institute of Electrical and Electronics Engineers (IEEE)

Keywords

• Electrical and Electronic Engineering
• Electronic, Optical and Magnetic Materials

Details

• CRID: 1360862723246045440
• NII Article ID: 30019700751
• DOI: 10.1109/20.617744
• ISSN: 00189464
• Web Site: http://xplorestaging.ieee.org/ielx5/20/13466/00617744.pdf?arnumber=617744
• Data Source:
  • Crossref
  • CiNii Articles