Relationship between total losses under tensile stress in 3 percent Si-Fe single crystals and their orientations near

• T. Nozawa

• T. Yamamoto

• Y. Matsuo

• Y. Ohya

収録刊行物

• IEEE Transactions on Magnetics

  IEEE Transactions on Magnetics 14 (4), 252-257, 1978-07

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360855571299807744
• NII論文ID: 30019710175
• NII書誌ID: AA00667933
• DOI: 10.1109/tmag.1978.1059767
• ISSN: 19410069
• ISSN: 00189464
• Web Site: http://xplorestaging.ieee.org/ielx5/20/22832/01059767.pdf?arnumber=1059767
• データソース種別:
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  • CiNii Articles