Nonscan design for testability for synchronous sequential circuits based on conflict resolution

• Dong Xiang

• Yi Xu

• H. Fujiwara

収録刊行物

• IEEE Transactions on Computers

  IEEE Transactions on Computers 52 (8), 1063-1075, 2003-08

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Computational Theory and Mathematics
• Hardware and Architecture
• Theoretical Computer Science
• Software

詳細情報

• CRID: 1360579819912703872
• NII論文ID: 30019744941
• DOI: 10.1109/tc.2003.1223640
• ISSN: 00189340
• Web Site: http://xplorestaging.ieee.org/ielx5/12/27484/01223640.pdf?arnumber=1223640
• データソース種別:
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  • CiNii Articles