On an improved design approach for C-testable orthogonal iterative arrays

• HUANG W. K.

Journal

• IEEE Trans. Comput.-Aided Des. Circuits Syst.

  IEEE Trans. Comput.-Aided Des. Circuits Syst. 7 (5), 609-615, 1988

Details

• CRID: 1573668925953680384
• NII Article ID: 30019754050
• DOI: 10.1109/43.3199
• Data Source:
  • CiNii Articles