Capacitance coupling immune, transient sensitive accelerator for resistive interconnect signals of subquarter micron ULSI

• T. Iima

• M. Mizuno

• T. Horiuchi

• M. Yamashina

収録刊行物

• IEEE Journal of Solid-State Circuits

  IEEE Journal of Solid-State Circuits 31 (4), 531-536, 1996-04

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering

詳細情報

• CRID: 1362825894262682496
• NII論文ID: 30019786761
• NII書誌ID: AA00667434
• DOI: 10.1109/4.499729
• ISSN: 00189200
• Web Site: http://xplorestaging.ieee.org/ielx4/4/10804/00499729.pdf?arnumber=499729
• データソース種別:
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  • CiNii Articles