Spreading-resistance temperature sensor on silicon-on-insulator

• P.T. Lai

• Bin Li

• C.L. Chan

• J.K.O. Sin

収録刊行物

• IEEE Electron Device Letters

  IEEE Electron Device Letters 20 (11), 589-591, 1999-11

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1364233270002893568
• NII論文ID: 30019829481
• DOI: 10.1109/55.798053
• ISSN: 15580563
• ISSN: 07413106
• Web Site: http://xplorestaging.ieee.org/ielx5/55/17312/00798053.pdf?arnumber=798053
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