On-chip oscilloscopes for noninvasive time-domain measurement of waveforms in digital integrated circuits

• Yu Zheng

• K.L. Shepard

収録刊行物

• IEEE Transactions on Very Large Scale Integration (VLSI) Systems

  IEEE Transactions on Very Large Scale Integration (VLSI) Systems 11 (3), 336-344, 2003-06

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering
• Hardware and Architecture
• Software

詳細情報

• CRID: 1361981470335428608
• NII論文ID: 30020164325
• DOI: 10.1109/tvlsi.2003.812313
• ISSN: 15579999
• ISSN: 10638210
• Web Site: http://xplorestaging.ieee.org/ielx5/92/27383/01218208.pdf?arnumber=1218208
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