Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope
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- Nancy A. Burnham
- Surface Chemistry Branch, Code 6177, Naval Research Laboratory, Washington, DC 20375-5000
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- Richard J. Colton
- Surface Chemistry Branch, Code 6177, Naval Research Laboratory, Washington, DC 20375-5000
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抄録
<jats:p>An atomic force microscope (AFM) has been configured so that it measures the force between a tip mounted on a cantilever beam and a sample surface as a function of the tip–surface separation. This allows the AFM to study both the nanomechanical properties of the sample and the forces associated with the tip–surface interaction. More specifically, the AFM can measure the elastic and plastic behavior and hardness via nanoindentation, van der Waals forces, and the adhesion of thin-film and bulk materials with unprecedented force and spatial resolution. The force resolution is currently 1 nanonewton, and the depth resolution is 0.02 nm. Additionally, the instrument itself is compact and relatively inexpensive.</jats:p>
収録刊行物
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- Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
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Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 7 (4), 2906-2913, 1989-07-01
American Vacuum Society
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詳細情報
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- CRID
- 1362825895940141440
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- NII論文ID
- 30020304816
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- NII書誌ID
- AA10635106
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- DOI
- 10.1116/1.576168
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- ISSN
- 15208559
- 07342101
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- データソース種別
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