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- S. Morishita
- Applied Physics Laboratory, Department of Systems Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466, Japan
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- F. Okuyama
- Applied Physics Laboratory, Department of Systems Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466, Japan
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抄録
<jats:p>Monocrystalline Mo tips oriented to [110] are shown to be sharpened into atomic dimensions, by inert-gas ions impinging along the [110] axis. Xe+ ions accelerated to a few keV provided Mo tips less than 50 Å in apex diameter, in a time interval of 10 min or so. Much smaller radii of curvature were achieved by prolonged Ar+ sputtering at lower energies. It is believed that the technique proposed is promising for preparing focused ion and electron beam sources.</jats:p>
収録刊行物
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- Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
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Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 9 (1), 167-169, 1991-01-01
American Vacuum Society
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詳細情報 詳細情報について
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- CRID
- 1362544419869536000
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- NII論文ID
- 30020306736
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- NII書誌ID
- AA10635106
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- DOI
- 10.1116/1.577121
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- ISSN
- 15208559
- 07342101
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- データソース種別
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